The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Sep. 28, 2015
Emc Corporation, Hopkinton, MA (US);
Alan Zhongjie Wu, Beijing, CN;
Colin Yong Zou, Beijing, CN;
Chris Zirui Liu, Beijing, CN;
Fei Wang, Santa Clara, CA (US);
Zhengli Yi, Beijing, CN;
EMC IP Holding Compnay LLC, Hopkinton, MA (US);
Abstract
Embodiments of the present invention relate to a method and apparatus for improving performance of a de-clustered disk array by making statistics on a number and types of active input/output (I/O) requests of each of the plurality of physical disks; dividing the plurality of physical disks at least into a first schedule group and a second schedule group based on the statistic number and types of the active I/O requests of the each physical disk for a predetermined time period, the first schedule group having a first schedule priority, the second schedule group having a second schedule priority higher than the first schedule priority; and selecting, in a decreasing order of the schedule priority, a physical disk for schedule from one of the resulting schedule groups thereby preventing too many I/O requests from concentrating on some physical disks and thereby improve overall performance of a de-clustered RAID.