The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Oct. 16, 2013
Applicant:
Nitto Denko Corporation, Ibaraki-shi, Osaka, JP;
Inventors:
Tomohiro Takeyasu, Ibaraki, JP;
Yusuke Yamamoto, Ibaraki, JP;
Minoru Kanatani, Ibaraki, JP;
Kazuaki Sasa, Ibaraki, JP;
Assignee:
NITTO DENKO CORPORATION, Ibaraki-shi, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/044 (2006.01); H01B 1/08 (2006.01);
U.S. Cl.
CPC ...
G06F 3/044 (2013.01); H01B 1/08 (2013.01); Y10T 428/265 (2015.01);
Abstract
A transparent conductive film includes a film base, and a polycrystalline layer of indium tin oxide formed on the film base. The polycrystalline layer has a gradient of a concentration of tin oxide in a thickness direction thereof. A maximum value of the concentration of tin oxide in the thickness direction of the polycrystalline layer is 6 wt % to 12 wt %. The polycrystalline layer has a thickness of 10 nm to 35 nm. An average value of maximum sizes of crystal grains composing the polycrystalline layer is 380 nm to 730 nm.