The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

Apr. 14, 2014
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Ahmed My Cheta, Pearland, TX (US);

Mark Eugene Shepard, Roanoke, VA (US);

Seth Andrew Hendrickson, Gardnerville, NV (US);

Benjamin David Laskowski, Greenville, SC (US);

Patrick Nkrumah Adasa, Marietta, GA (US);

Mohamed Ahmed Aljahmi, Dearborn, MI (US);

Andrew David McArthur, Salem, VA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06F 17/14 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4184 (2013.01); G06F 17/141 (2013.01); G05B 2219/41417 (2013.01); Y02P 90/14 (2015.11);
Abstract

A system may include a controller that may control operations of a device according to a control loop and characterize a frequency response of the device while the device is operating. The controller may characterize the frequency response by adding a perturbation signal to any signal in the control loop. The controller may then determine a first transformed signal by performing a first discrete Fourier transform on a first signal in the control loop at a frequency of the perturbation signal and determine a second transformed signal by performing a second discrete Fourier transform on a second signal in the control loop at the frequency of the perturbation signal. The controller may then determine the frequency response at the frequency by comparing a first amplitude and a first phase of the first transformed signal to a second amplitude and a second phase of the second transformed signal.


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