The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Nov. 05, 2015
Applicant:
Olympus Corporation, Shibuya-ku, Tokyo, JP;
Inventor:
Yuya Miyazono, Tokyo, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/16 (2006.01); G02B 13/00 (2006.01); G02B 21/00 (2006.01); G02B 21/02 (2006.01); G02B 27/14 (2006.01);
U.S. Cl.
CPC ...
G02B 21/16 (2013.01); G02B 13/0095 (2013.01); G02B 21/002 (2013.01); G02B 21/025 (2013.01); G02B 27/141 (2013.01);
Abstract
A scanning microscope includes a scanner, an objective irradiates a sample with illumination light deflected by the scanner, and a beam splitter that is arranged between the objective and an exit pupil position, and that reflects one of the illumination light and observation light from the sample and transmits the other. The objective has the exit pupil position outside the objective.