The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Apr. 26, 2016
Omnivision Technologies, Inc., Santa Clara, CA (US);
Chuen-Yi Yin, New Taipei, TW;
Jau-Jan Deng, Taipei, TW;
OmniVision Technologies, Inc., Santa Clara, CA (US);
Abstract
A compact three-surface wafer-level lens system for imaging a scene onto an image plane includes a one-sided wafer-level lens and a two-sided wafer-level lens disposed between the one-sided wafer-level lens and the image plane. The total track length of the wafer-level lens system is no more than 2.2 millimeters. The maximum transverse extent (in dimensions transverse to the optical axis) of the lens system and associated light propagating therethrough is no greater than 1.8 millimeters. The field of view angle of the lens system is at least 100 degrees.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile