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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9798026 B1

PDFFull Text
Date of Patent:
Oct. 24, 2017

Filed:

Jun. 29, 2016

Elastic reverse-time migration system and method using absolute value function for improving the quality of subsurface structure imaging

Applicant:

Korea Institute of Geoscience and Mineral Resources, Daejeon, KR;

Inventors:

Jiho Ha, Busan, KR;

Wookeen Chung, Busan, KR;

Sungryul Shin, Busan, KR;

Young-Jun Kim, Daejeon, KR;

Wonsik Kim, Daejeon, KR;

Assignee:

KOREA INSTITUTE OF GEOSCIENCE AND MINERAL RESOURCES, Daejeon, KR;

Attorney:

Hauptman Ham, LLP

Primary Examiner:

Daniel L Murphy

Int. Cl.
CPC ...
G01V 1/28 (2006.01); G01V 1/36 (2006.01);
U.S. Cl.
CPC ...
G01V 1/282 (2013.01); G01V 2210/125 (2013.01); G01V 2210/51 (2013.01); G01V 2210/67 (2013.01); G01V 2210/679 (2013.01);
Abstract

Provided is elastic reverse-time migration system and method using an absolute value function for improving the quality of subsurface structure images, and more particularly, elastic reverse-time migration system and method using an absolute value function for improving the quality of subsurface structure images capable of minimizing waveform changing by separating wavefields using stress-displacement relationships and improving accuracy of the subsurface structure images by applying the absolute value function to migration images.

Find Patent Forward Citations

Ha, Jiho. (2017). Elastic reverse-time migration system and method using absolute value function for improving the quality of subsurface structure imaging (U.S. Patent No. 9798026). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9798026

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