The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Mar. 17, 2017
Ataitec Corporation, San Jose, CA (US);
Ching-Chao Huang, San Jose, CA (US);
AtaiTec Corporation, San Jose, CA (US);
Abstract
The present disclosure involves method and apparatus for de-embedding test fixture to extract the electrical behavior of device under test. A calibration board with both '1× open' and '1× short' test structures is fabricated and measured by equipment such as vector network analyzer that produces S parameters. The S parameters of “1× open” and “1× short”, with or without correction factors, are combined to produce the S parameters of equivalent “2× thru” test structure. The S parameters of equivalent “2× thru” are used subsequently to de-embed the test fixture. This present disclosure gives a simpler and more accurate method to create the S parameters of “2× thru” for de-embedding.