The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Sep. 15, 2014
Cameron Anthony Piron, Toronto, CA;
Alexander Gyles Panther, Toronto, CA;
Chad Tyler Harris, Toronto, CA;
Stephen B. E. Mcfadyen, Toronto, CA;
Cameron Anthony Piron, Toronto, CA;
Alexander Gyles Panther, Toronto, CA;
Chad Tyler Harris, Toronto, CA;
Stephen B. E. McFadyen, Toronto, CA;
SYNAPTIVE MEDICAL (BARBADOS) INC., Bridgetown, BB;
Abstract
A method of data acquisition at a magnetic resonance imaging (MRI) system is provided. The system receives at least a portion of raw data for an image, and detects anomalies in the portion of raw data received. When anomalies are detected, the system can correct those anomalies dynamically, without waiting for a new scan to be ordered. The system can attempt to scan the offending portion of the raw data, either upon detection of the anomaly or at some point during the scan. The system can also correct anomalies using digital correction methods based on expected values. The anomalies can be detected based on variations from thresholds, masks and expected values all of which can be obtained using one of the ongoing scan, previously performed scans and apriori information relating to the type of scan being performed.