The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Aug. 19, 2015
China Agricultural University, Beijing, CN;
Yankun Peng, Beijing, CN;
Juan Zhao, Beijing, CN;
China Agricultural University, Beijing, CN;
Abstract
An optical testing system includes: a testing probe, a collecting unit, and a processing unit, wherein the testing probe includes a plurality of spectrum photodiodes used for emitting and casting monochromatic light to a sample, wherein the wavelength of the light emitted by at least one spectrum photodiode is different from that of any other. The collecting unit collects multi-way signal light obtained after the emitted monochromatic light is reflected by the sample surface. The processing unit includes a photoelectric conversion module, an adding module and a testing module. The photoelectric conversion module converts the collected multi-way signal light respectively to multi-way electrical signals. The adding module performs an adding operation for the multi-way electrical signal to obtain an operation result. The testing module tests a quality parameter of the sample according to the operation result, and outputs a testing result.