The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
May. 10, 2013
Applicant:
Menicon Singapore Pte Ltd., Singapore, SG;
Inventors:
Stephen Donald Newman, Singapore, SG;
Hiroyama Oyama, Erlangen, DE;
Johannes Pfund, Erlangen, DE;
Juergen Lamprecht, Erlangen, DE;
Assignee:
MENICON SINGAPORE PTE LTD., Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); G01M 11/02 (2006.01); G01N 21/88 (2006.01); G01N 21/958 (2006.01); G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
G01M 11/0214 (2013.01); G01N 21/8803 (2013.01); G01N 21/958 (2013.01); G01N 21/03 (2013.01); G01N 2021/9583 (2013.01);
Abstract
An apparatus for inspecting lenses includes an inspection system including an open cuvette, a communicatively coupled CT measurement device, and a user interface communicatively coupled to the inspection system. According to one embodiment, the lens inspection system provides a single instrument for inspecting the quality of a lens, thereby minimizing the transference of the lens from one inspection component to another.