The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Dec. 23, 2014
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventors:
Akira Sano, Shiojiri, JP;
Takashi Nagate, Suwa, JP;
Kazunori Sakurai, Chino, JP;
Nozomu Hirokubo, Fujimi, JP;
Assignee:
Seiko Epson Corporation, , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/02 (2006.01); G01J 3/45 (2006.01); G01J 3/26 (2006.01); G01J 3/32 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2823 (2013.01); G01J 3/0202 (2013.01); G01J 3/027 (2013.01); G01J 3/0235 (2013.01); G01J 3/0272 (2013.01); G01J 3/0289 (2013.01); G01J 3/0291 (2013.01); G01J 3/26 (2013.01); G01J 3/28 (2013.01); G01J 3/32 (2013.01);
Abstract
A spectrometry system includes an imaging apparatus that includes an imaging element which captures an image, and a spectroscopic module that includes a wavelength variable interference filter and an attachment unit which holds the wavelength variable interference filter, is provided to be attachable to and detachable from the imaging apparatus, and can dispose the wavelength variable interference filter on an optical path of incident light to the imaging element during attachment to the imaging apparatus.