The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Aug. 26, 2014
Applicant:
General Electric Company, Schenectady, NY (US);
Inventors:
Alex David Corwin, Niskayuna, NY (US);
Christine Lynne Pitner, Niskayuna, NY (US);
David Andrew Shoudy, Niskayuna, NY (US);
Kevin Bernard Kenny, Niskayuna, NY (US);
Assignee:
General Electric Company, Niskayuna, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G01J 1/02 (2006.01); G01N 21/64 (2006.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01J 1/0228 (2013.01); G01N 21/274 (2013.01); G01N 21/64 (2013.01); G01N 21/6458 (2013.01); G02B 21/365 (2013.01);
Abstract
Approaches are disclosed for calibrating a plurality of imaging devices, such as microscopes. In certain implementations, a calibration plate is employed that include a variety of calibration features. Imaging devices calibrated in accordance with the present approaches may be used to generate images having consistent attributes, such as brightness, regardless of which imaging device is employed.