The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

Feb. 12, 2014
Applicant:

Finetek Co., Ltd., New Taipei, TW;

Inventors:

Liang-Chi Chang, New Taipei, TW;

Teng-Chin Yu, New Taipei, TW;

Kai-Di Yang, New Taipei, TW;

Ting-Kuo Wu, New Taipei, TW;

Chao-Kai Cheng, New Taipei, TW;

Assignee:

Finetek Co., Ltd., New Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 23/284 (2006.01); G01N 27/22 (2006.01); G01K 13/10 (2006.01); G01K 1/02 (2006.01);
U.S. Cl.
CPC ...
G01F 23/284 (2013.01); G01K 1/026 (2013.01); G01K 13/10 (2013.01); G01N 27/22 (2013.01); G01N 27/228 (2013.01);
Abstract

A measurement device for detecting a material level and a temperature has a cable, a level sensing module, a thermal sensing module, a processing module, and a power module. The measurement device detects difference of currents between an electrode of the cable and the earth, and calculates a material level of a material stored in a silo according to the RF admittance. The cable comprises a plurality of thermal sensing units for detecting a temperature of the material. The measurement device further calibrates a material capacitance of the material with the temperature for avoiding an error caused by an inaccurate parameter.


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