The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 24, 2017
Filed:
Jan. 09, 2015
Lingfei Meng, Redwood City, CA (US);
Liyang LU, Houston, TX (US);
Kathrin Berkner, Los Altos, CA (US);
Ivana Tosic, Berkeley, CA (US);
Lingfei Meng, Redwood City, CA (US);
Liyang Lu, Houston, TX (US);
Kathrin Berkner, Los Altos, CA (US);
Ivana Tosic, Berkeley, CA (US);
Ricoh Company, Ltd., Tokyo, JP;
Abstract
A plenoptic camera captures a plenoptic image of an object illuminated by a point source (preferably, collimated illumination). The plenoptic image is a sampling of the four-dimensional light field reflected from the object. The plenoptic image is made up of superpixels, each of which is made up of subpixels. Each superpixel captures light from a certain region of the object (i.e., a range of x,y spatial locations) and the subpixels within a superpixel capture light propagating within a certain range of directions (i.e., a range of u,v spatial directions). Accordingly, optical properties estimation, surface normal reconstruction, depth estimation, and three-dimensional rendering can be provided by processing only a single plenoptic image. In one approach, the plenoptic image is used to estimate the bidirectional reflectance distribution function (BRDF) of the object surface.