The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

Aug. 12, 2014
Applicant:

Illinois Tool Works Inc., Glenview, IL (US);

Inventors:

William Masek, North Attleboro, MA (US);

Michael Taliaferro, Dallas, TX (US);

Jeffrey Manney, South Easton, MA (US);

Assignee:

ILLINOIS TOOL WORKS INC., Glenview, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/004 (2006.01); G01B 21/04 (2006.01);
U.S. Cl.
CPC ...
G01B 5/004 (2013.01); G01B 21/04 (2013.01); G05B 2219/37608 (2013.01);
Abstract

The present disclosure relates to a method in materials testing to automatically locate the center of a feature on or in an object using the off-axis force feedback of a loadcell. In this disclosure, either a simplified model of the product or device being tested, or the product itself, is placed under the loadcell probe with the feature of interest roughly aligned under the probe tip. The probe is driven down into the feature. The product is automatically positioned relative to the probe in the x-direction until the side of the probe contacts the side of the feature. Contact is determined by monitoring the force feedback from the loadcell. When the vertical force from the side-load surpasses a pre-determined setpoint, contact is assumed and the value of the x-position of the product with respect to the probe is recorded. The product is then repositioned in the opposite direction in the x-axis to record the touch load on the other side. The center is then calculated as the average of the x values. The process is repeated along the y-axis. This data is then used to calculate the center of the feature and the product can be positioned at this location so that the probe is centered over the center thereof.


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