The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

Jun. 04, 2015
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

Richard J. Wright, Tucson, AZ (US);

James G. Sierchio, Tucson, AZ (US);

William R. Owens, Tucson, AZ (US);

Thomas M. Crawford, Marana, AZ (US);

Myron E. Calkins, Jr., Tucson, AZ (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
F42B 12/36 (2006.01); G01N 19/06 (2006.01); G01P 15/06 (2006.01); F42C 19/06 (2006.01); G01N 9/00 (2006.01); G01P 15/08 (2006.01); G01B 5/06 (2006.01); F42B 12/02 (2006.01); G01B 11/06 (2006.01); G01N 9/36 (2006.01); F41J 5/06 (2006.01);
U.S. Cl.
CPC ...
F42B 12/365 (2013.01); F41J 5/06 (2013.01); F42B 12/02 (2013.01); F42C 19/06 (2013.01); G01B 5/06 (2013.01); G01B 11/06 (2013.01); G01N 9/36 (2013.01); G01P 15/06 (2013.01); G01P 15/0891 (2013.01); G01N 9/00 (2013.01);
Abstract

A hyper-velocity impact sensor is configured to probe a mass of material consumed upon impact with an object. The probe can extract density and thickness characteristics of the impacted object, which can be used to classify the object.


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