The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2017

Filed:

Dec. 18, 2013
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Brian E. Nett, Waukesha, WI (US);

Roy A. Nilsen, Waukesha, WI (US);

Grant M. Stevens, Cedarburg, WI (US);

Assignee:

GENERAL ELECTRIC COMPANY, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01);
U.S. Cl.
CPC ...
A61B 6/542 (2013.01); A61B 6/032 (2013.01); A61B 6/545 (2013.01); A61B 6/482 (2013.01); G06F 17/5009 (2013.01);
Abstract

An imaging system allows for modification of data acquisition parameters, where the parameters affect dose distribution. The system includes a library of exams, and a computer programmed to obtain a set of scanning parameters for image data acquisition and image reconstruction, obtain scan data from the library of exams that is based on a similarity metric for a patient to be scanned, simulate a new scan of the patient using the obtained scan data and using the obtained set of scanning parameters, and generate a new set of scanning parameters based on the simulation.


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