The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Mar. 29, 2013
Applicant:

Nippon Telegraph and Telephone Corporation, Chiyoda-ku, JP;

Inventors:

Hiroshi Yamamoto, Musashino, JP;

Sorami Nakamura, Musashino, JP;

Hirotada Honda, Musashino, JP;

Daisuke Ikegami, Musashino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 12/26 (2006.01); G06F 11/34 (2006.01); H04L 29/08 (2006.01); H04L 29/06 (2006.01);
U.S. Cl.
CPC ...
H04L 43/0852 (2013.01); G06F 11/3419 (2013.01); H04L 67/10 (2013.01); H04L 67/42 (2013.01); G06F 2201/81 (2013.01);
Abstract

A user experienced quality estimation apparatus estimating a user experienced waiting time of an application in an user terminal, includes: a computer configured to: obtain, as estimation target logs, a duration time of each process of data obtaining, script execution and screen rendering performed in an estimation target period in the user terminal, and to store the estimation target logs in a received log storage unit; read out the estimation target logs from the received log storage unit, and output logs, excluding logs having data duration time shorter than a predetermined short time process threshold or longer than a predetermined long time process threshold; calculate, as multiplicity, the number of processes in a timeslot of a constant time length for the output logs; and extract a continuous region from data quantized by the quantization unit.


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