The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Jun. 30, 2016
Applicant:

Litepoint Corporation, Sunnyvale, CA (US);

Inventors:

Christian Volf Olgaard, Saratoga, CA (US);

Roman Schilter, Sunnyvale, CA (US);

Minh-Chau Huynh, San Mateo, CA (US);

Carsten Andersen, Vaerloese, DK;

Assignee:

LitePoint Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/29 (2015.01); H04B 17/15 (2015.01); H04B 7/06 (2006.01);
U.S. Cl.
CPC ...
H04B 17/29 (2015.01); H04B 7/0617 (2013.01); H04B 7/0682 (2013.01); H04B 17/15 (2015.01);
Abstract

Method for testing implicit beamforming operation of a radio frequency (RF) data packet signal transceiver device under test (DUT), including transmitting to the DUT combinations of a multidirectional (e.g., legacy) RF test signal and at least two unidirectional (e.g., beamformed) RF test signals with different signal directivity patterns, and monitoring signal strengths of signals received from the DUT in response to each signal. Signal directivity patterns can be controlled by transmitting multiple phase-controlled RF signals via separate arrays of multiple antenna elements to the DUT within a multipath RF signal environment, such as an electromagnetically shielded enclosure.


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