The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Sep. 12, 2016
Applicant:

Analog Devices, Inc., Norwood, MA (US);

Inventor:

Siddharth Devarajan, Arlington, MA (US);

Assignee:

ANALOG DEVICES, INC., Norwood, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/06 (2006.01); H03M 1/12 (2006.01); H03M 1/10 (2006.01);
U.S. Cl.
CPC ...
H03M 1/1215 (2013.01); H03M 1/0634 (2013.01); H03M 1/1009 (2013.01); H03M 1/124 (2013.01);
Abstract

A time-interleaved analog-to-digital converter (ADC) uses M analog-to-digital converters to sample an analog input signal to produce digital outputs. The M ADCs, operating in a time-interleaved fashion, can increase the sampling speed several times compared to the sampling speed of just one ADC. The time-interleaved ADC can be programmed and reconfigured to trade one performance metric for another. For example, more time can be given to comparator to improve bit error rate or more time can be given to an amplifier for improved settling which improves SNR, SFDR etc. If the time-interleaved converters are randomized, then the amount of 'color' in the noise floor shape can also be traded for other performance metrics.


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