The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Jan. 26, 2015
Fujifilm Corporation, Tokyo, JP;
Takashi Tajima, Ashigarakami-gun, JP;
Takeshi Kuwabara, Ashigarakami-gun, JP;
Yusuke Kitagawa, Ashigarakami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
In capturing an image of a grid by an image detector, a measurement pixel that is not in the position of a specific point having a maximum or minimum value of an output signal is referred to as a first measurement pixel, and a measurement pixel that is in the position of the specific point is referred to as a second measurement pixel. The disposition of the first and second measurement pixels are determined so as to satisfy the following condition: fG/fN≠odd number, wherein fG is a grid frequency and fN is a Nyquist frequency of pixels; and in shifting the grid C times by one pixel, the number of the first measurement pixels is larger than that of the second measurement pixels at any time in the range of a cycle C of a repetition pattern appearing in the image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile