The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Jun. 28, 2016
Applicant:

Ngr Inc., Yokohama, JP;

Inventors:

Hideaki Teshima, Yokohama, JP;

Kazufumi Kubota, Yokohama, JP;

Eiji Sato, Yokohama, JP;

Shigeyuki Sato, Yokohama, JP;

Kenichiro Kashiwazaki, Yokohama, JP;

Yuta Uraike, Yokohama, JP;

Assignee:

NGR Inc., Yokohama, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); H01J 37/22 (2006.01); H01J 37/28 (2006.01); H01J 37/06 (2006.01); H01J 37/147 (2006.01); H01J 37/244 (2006.01);
U.S. Cl.
CPC ...
H01J 37/222 (2013.01); H01J 37/06 (2013.01); H01J 37/147 (2013.01); H01J 37/244 (2013.01); H01J 37/28 (2013.01); H01J 2237/0216 (2013.01); H01J 2237/2448 (2013.01);
Abstract

There is disclosed an image generation apparatus which is capable of generating a clear image by reducing vibration of the image. The image generation apparatus includes an electron-optics column having an electron gun, a deflector, a condenser lens, and an objective lens, a displacement detector for detecting a displacement of an XY stage, a stage-position measuring device for specifying a position of the XY stage based on an output signal of the displacement detector, an accelerometer for detecting vibration of the electron-optics column, an acceleration-signal processing device for processing an output signal of the accelerometer, and a deflection-controlling device for controlling operation of the deflector. The deflection-controlling device adds a first vibration signal outputted from the acceleration-signal processing device to a second vibration signal outputted from the stage-position measuring device to generate a deflection correcting signal, and causes the deflector to correct the deflection of a charged-particle beam based on the deflection correcting signal.


Find Patent Forward Citations

Loading…