The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Feb. 26, 2014
Applicant:

Mitsubishi Heavy Industries, Ltd., Tokyo, JP;

Inventors:

Kazushige Namba, Tokyo, JP;

Tomonori Shichida, Tokyo, JP;

Naoto Kawase, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21C 17/01 (2006.01); G21C 17/013 (2006.01); G21C 17/017 (2006.01);
U.S. Cl.
CPC ...
G21C 17/013 (2013.01); G21C 17/01 (2013.01); G21C 17/017 (2013.01);
Abstract

There is provided an inspection device for inspecting an inner surface of a nozzle provided in a reactor vessel. The inspection device includes: a device frame, an inspection unit provided on the device frame, an inspection unit push-out moving mechanism for pushing out and moving the inspection unit to the inner surface of the nozzle, a rotation moving mechanism for rotating and moving the inspection unit, a calibration test unit arranged on the device frame for calibrating the inspection unit; and a calibration test unit forward/backward moving mechanism for moving the calibration test unit forward or backward in the direction along the central axis with regard to a track where the inspection unit makes push-out movement.


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