The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Feb. 05, 2015
Megachips Corporation, Osaka-shi, JP;
Kenta Nagamine, Osaka, JP;
Hiromu Hasegawa, Osaka, JP;
MegaChips Corporation, Osaka-shi, JP;
Abstract
A state estimation apparatus appropriately estimates the internal state of an observation target by calculating a likelihood from observation data, and tracks, for example, multiple objects in a moving image and detects a new object and adds the object as a tracking target in an appropriate manner. A labeling unit detects a closed area from an observation image, and adds a label number to the closed area to generate a label image. A likelihood obtaining unit generates an object-erased image for new object detection by erasing image areas corresponding to all the currently-tracked objects. The apparatus performs the process for detecting a new object using the object-erased image for new object detection based on label numbers. The apparatus is appropriately prevented from erroneously determining that an area of the object-erased image for new object detection corresponding to the currently-tracked object and remaining after the erasure corresponds to a new object.