The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Mar. 13, 2014
Ventana Medical Systems, Inc., Tucson, AZ (US);
Pascal Bamford, San Diego, CA (US);
Srinivas Chukka, San Jose, CA (US);
Lou Dietz, Mountain View, CA (US);
Ronald T. Kurnik, Foster City, CA (US);
Bikash Sabata, Cupertino, CA (US);
Anindya Sarkar, Milpitas, CA (US);
Olcay Sertel, Sunnyvale, CA (US);
VENTANA MEDICAL SYSTEMS, INC., Tucson, AZ (US);
Abstract
Processing of images acquired via fluorescence microscopy by identifying broadband and other undesired signals from the component signals of a scanned image, and processing selected regions of the image that are known to contain signals of interest, thereby extracting or identifying desired signals while subtracting undesired signals. One or more broadband signals are recognized by their unique signature and ubiquitous dispersion through the image. Regions of the scanned image may be tagged as consisting of predominantly broadband signals and are ignored during a spectral unmixing process. The remaining regions of the image, or selected regions of the image known to contain desired signals, may be unmixed, and the plurality of reference spectra subtracted from the components to extract or identify the target signals. The set of target signals may be refined by eliminating known or obvious sources of noise by, for instance, being compared to known or ideal sets of signals from similar materials.