The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Oct. 02, 2015
Mitsubishi Electric Corporation, Chiyoda-ku, JP;
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Osamu Nasu, Chiyoda-ku, JP;
Haruhiko Takeyama, Chiyoda-ku, JP;
Toru Sasaki, Chiyoda-ku, JP;
Takuya Noguchi, Chiyoda-ku, JP;
Hajime Nakajima, Chiyoda-ku, JP;
Yoshinao Tatei, Chiyoda-ku, JP;
Shigenori Takeda, Chiyoda-ku, JP;
Takeshi Musha, Chiyoda-ku, JP;
Amit Agrawal, Cambridge, MA (US);
Jay E. Thornton, Cambridge, MA (US);
Mitsubishi Electric Corporation, Chiyoda-ku, JP;
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Abstract
To obtain a position detection device capable of detecting highly accurate and robust position by suppressing affect of error detection of an edge, provided is a configuration for performing a validity determination of edges detected by binarizing an image signal () converted by a light-receiving element () for receiving light irradiated from a light source () toward a scale () having a code pattern, and performing position detection after removing the edges determined to be invalid as edges that have been affected by foreign matter and the like among the edges on which the validity determination has been performed.