The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Aug. 12, 2014
Applicant:
Mim Software Inc., Cleveland, OH (US);
Inventor:
Jonathan William Piper, Cleveland Heights, OH (US);
Assignee:
MIM SOFTWARE INC., Cleveland, OH (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06T 7/12 (2017.01); G06T 7/174 (2017.01);
U.S. Cl.
CPC ...
G06K 9/6207 (2013.01); G06T 7/12 (2017.01); G06T 7/174 (2017.01); G06T 2207/10072 (2013.01); G06T 2207/30004 (2013.01);
Abstract
Systems and methods are provided for contouring a set of medical images. Deformation field data is generated between a source image and a target image of the set of medical images. The deformation field data relates structures in the source image to corresponding structures in the target image and is generated in accordance with a deformable registration algorithm. The deformation field data is utilized to generate target contour data associated with the target image from source contour data, associated with the source image, that identifies one or more objects within the source image.