The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Mar. 29, 2016
Fujifilm Corporation, Tokyo, JP;
Masayuki Ukishima, Kanagawa, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
Provided are image inspection method and apparatus, and an ink jet printing apparatus that can highly accurately detect a stripe defect. An inspection image obtained by an imaging device imaging a printed matter printed by an ink jet printing apparatus including a line head is acquired. Each of at least one non-scanning direction linear structural element that is a linear structural element in a direction not parallel to a direction of scanning by the line head relative to a medium is used to execute morphology processing of a grayscale image to thereby smooth the inspection image to create a first smoothed inspection image (SS). A stripe defect extending in the scanning direction is detected by using at least (1) one of the inspection image and a second smoothed inspection image created based on the inspection image and (2) the first smoothed inspection image.