The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Jun. 10, 2005
Mauricio Antonio Hernandez-sherrington, Gilroy, CA (US);
Ching-tien Ho, San Jose, CA (US);
Mary Ann Roth, San Jose, CA (US);
Lingling Yan, San Jose, CA (US);
Mauricio Antonio Hernandez-Sherrington, Gilroy, CA (US);
Ching-Tien Ho, San Jose, CA (US);
Mary Ann Roth, San Jose, CA (US);
Lingling Yan, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Various embodiments of a method, system and article of manufacture to discover relationships among a first set of elements and a second set of elements are provided. At least one metric algorithm is identified based on a metric selection parameter. A raw result is determined based on the at least one metric algorithm, a first specified structural description of the first set of elements and a second specified structural description of the second set of elements. The raw result comprises a plurality of relationship measurements and the raw result is ordered. In some embodiments, a balanced result is produced based on the raw result and a matching strategy algorithm. In other embodiments, the matching strategy algorithm is identified based on a matching strategy selection parameter.