The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Dec. 15, 2014
Amazon Technologies, Inc., Seattle, WA (US);
James Michael Thompson, Seattle, WA (US);
Marc Stephen Olson, Bellevue, WA (US);
Jeevan Shankar, Amherst, MA (US);
Danny Wei, Seattle, WA (US);
John Robert Smiley, Issaquah, WA (US);
John Luther Guthrie, II, Bellevue, WA (US);
Nachiappan Arumugam, Seattle, WA (US);
Benjamin Arthur Hawks, Seattle, WA (US);
Amazon Technologies, Inc., Seattle, WA (US);
Abstract
Systems and methods are described for dynamically detecting outliers in a set of input/output (I/O) metrics collected and aggregated by a storage volume network. An I/O request is received by a storage volume network, and an agent of the storage volume network associates primary and secondary identifiers with that I/O request. For example, a trace may be associated with a request to write data to a storage volume network, and spans may be associated with the individual operations required to fulfill that request. Once gathered, I/O metrics may be aggregated based on the associated identifiers. I/O metric information regarding outliers may be received from the storage volume network, processed, and published by an I/O metrics service to identify the outliers among the primary and secondary identifiers. These outliers may then be stored for further analysis, and may be utilized to determine improvements to the performance of a storage volume network.