The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Dec. 06, 2013
Nec Corporation, Minato-ku, Tokyo, JP;
Takayuki Kuroda, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A test support device which can test all configurations of a system including a specific system component, comprehensively and quickly, is provided. A test support device () includes a storage unit () and an extraction processing unit (). A configuration of a system is defined with a plurality of functionalities to be maintained by the system and a set of programs implementing the functionalities respectively. The storage unit () stores component-relation information () which indicates an identifier of each of one or more systems, an identifier of each of a plurality of functionalities to be maintained by each of the systems, and an identifier of each of one or more programs being capable of implementing each of the functionalities. The extraction processing unit () extracts, when a functionality or a program is specified, a configuration of a system including the specified functionality or the specified program on the basis of the component-relation information (), and outputs the extracted configuration of a system.