The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Oct. 21, 2015
Applicant:
Sandisk Technologies Llc, Plano, TX (US);
Inventors:
Sahil Sharma, San Jose, CA (US);
Abhijeet Manohar, Bangalore, IN;
Mrinal Kochar, San Jose, CA (US);
Yong Huang, San Jose, CA (US);
Derek McAuley, San Jose, CA (US);
Mikhail Palityka, Ontario, CA;
Ivan Baran, San Jose, CA (US);
Aaron Lee, Mountain View, CA (US);
Assignee:
SANDISK TECHNOLOGIES LLC, Plano, TX (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G06F 11/10 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1068 (2013.01); G11C 29/52 (2013.01);
Abstract
When the number of bad columns in a memory or plane is less than a threshold number then a first Error Correction Code (ECC) scheme encodes user data in first pages of a first size. If the number of bad columns is greater than the threshold number then a second ECC scheme encodes the user data in second pages of a second size that is smaller than the first size.