The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Apr. 28, 2017
Applicant:

Quspin, Inc., Louiville, CO (US);

Inventors:

Orang Alem, Lafayette, CO (US);

Vishal Shah, Westminster, CO (US);

Svenja Knappe, Boulder, CO (US);

Assignee:

QuSpin, Inc., Louisville, CO (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01V 3/00 (2006.01); G01R 35/00 (2006.01); G01R 33/032 (2006.01); A61B 5/04 (2006.01);
U.S. Cl.
CPC ...
G01R 35/005 (2013.01); A61B 5/04008 (2013.01); G01R 33/032 (2013.01); A61B 2560/0223 (2013.01); A61B 2562/0223 (2013.01);
Abstract

A mutually calibrated magnetic imaging array system is described. The system includes a non-target magnetic source rigidly attached to a magnetometer, and an attached control unit to measure and adjust several parameters of a magnetic imaging array. A non-target magnetic field source is used to generate a well-defined and distinguishable spatial magnetic field distribution. The source is rigidly attached directly to a magnetometer, while the relative positions of the magnetometers are unknown. The magnetic imaging array is used to measure the strength of the non-target source magnetic fields and the information is used to calibrate several parameters of the array, such as, but not limited to, effective magnetometer positions and orientations with respect to each other and cross-talk between the magnetometers. The system, and method described herein eliminates the need for a separate calibration phantom.


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