The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Mar. 26, 2015
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
Michael Edwin Butenhoff, Minnesota City, MN (US);
Keith Ryan Green, Prosper, TX (US);
Anuj Jain, Irving, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/06 (2006.01); G01R 33/00 (2006.01); G01R 33/07 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0023 (2013.01); G01R 33/072 (2013.01);
Abstract
A method for verifying an operation of a Hall-effect sensor without an applied magnetic field. The method can include providing a bias signal to a first pair of terminals of a Hall-effect element, applying a Hall current signal to a second pair of terminals of the Hall-effect element, measuring a Hall output voltage across the second pair of terminals and comparing the measured Hall output voltage to an expected Hall output voltage that would be provided by a corresponding applied magnetic field.