The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Feb. 16, 2015
Applicant:

Novelis Inc., Atlanta, GA (US);

Inventors:

Heinrich Prinzhorn, Gottingen, DE;

Stefan Erdmann, Atlanta, GA (US);

Thomas Wuttke, Renshausen, DE;

Andreas Bauer, Gottingen, DE;

Bernd Abel, Markkleeberg, DE;

Ales Charvat, Markkleeberg, DE;

Assignee:

Novelis Inc., Atlanta, GA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 29/04 (2006.01); G01N 29/24 (2006.01); G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/2418 (2013.01); G01N 29/04 (2013.01); G01N 29/44 (2013.01); G01N 2291/0237 (2013.01); G01N 2291/02854 (2013.01); G01N 2291/102 (2013.01); G01N 2291/103 (2013.01);
Abstract

A measuring device for non-mechanical-contact measurement of a layer, the measuring device including a light source operative to generate a pulse adapted to interact with the layer so as to generate a thermal wave in a gas medium present adjacent the layer. The thermal wave causes an acoustic signal to be generated. The measuring device further includes a detector adapted to detect a first signal responsive to the acoustic signal, the detector not being in mechanical contact with the layer. The first signal is representative of the measured layer.


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