The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

May. 07, 2015
Applicants:

Tech4imaging Llc, Columbus, OH (US);

Ohio State Innovation Foundation, Columbus, OH (US);

Inventors:

Qussai Marashdeh, Columbus, OH (US);

Fernando Teixeira, Columbus, OH (US);

Burak Gurlek, Columbus, OH (US);

Zeeshan Zeeshan, Columbus, OH (US);

Assignees:

TECH4IMAGING LLC, Columbus, OH (US);

OHIO STATE INNOVATION FOUNDATION, Columbus, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/22 (2006.01); G06T 11/00 (2006.01); A61B 5/053 (2006.01);
U.S. Cl.
CPC ...
G01N 27/226 (2013.01); G06T 11/006 (2013.01); A61B 5/0536 (2013.01);
Abstract

A capacitance system having a capacitance sensor provides a high resolution Spatial-Adaptive Reconstruction Technique (SART) for use with Adaptive Electrical Capacitance Volume Tomography (AECVT). The system is adapted to analyze information provided by an image reconstruction of a first spatial region of an imaging domain of the sensor; provide control signals to the sensor to increase the resolution at a second spatial region of the imaging domain of the sensor based on the prior image reconstruction of the first spatial region; obtain image reconstruction information for the second spatial region of the imaging domain; and combine the image reconstruction information for the first spatial region and the second spatial region to obtain a combined image of the imaging domain.


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