The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Jan. 24, 2012
Applicants:

Patrick F. Henning, Concord, MA (US);

Thomas G. Barraclough, Maynard, MA (US);

Eric J. Olson, Phillipston, MA (US);

Stephen D. Lawrence, Ayer, MA (US);

Robert J. Yurko, Chelmsford, MA (US);

Inventors:

Patrick F. Henning, Concord, MA (US);

Thomas G. Barraclough, Maynard, MA (US);

Eric J. Olson, Phillipston, MA (US);

Stephen D. Lawrence, Ayer, MA (US);

Robert J. Yurko, Chelmsford, MA (US);

Assignee:

Spectro Scientific, Inc., Chelmsford, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01F 1/74 (2006.01); G01N 23/06 (2006.01); G01N 21/3577 (2014.01);
U.S. Cl.
CPC ...
G01N 23/06 (2013.01); G01N 21/3577 (2013.01);
Abstract

An integrated, portable sample analysis system and method. A viscometer subsystem receives a first portion of a sample. A spectrometer subsystem receives a second portion of the sample. A syringe pump subsystem receives a third portion of the sample and is configured to urge the third portion of the sample through a filter which collects particles in the sample thereon. An x-ray analysis subsystem is configured to x-ray the particles. The x-ray analysis subsystem also receives a fourth portion of the sample in order to determine the composition of any dissolved material in the sample. A processing subsystem provides a report concerning the sample and its viscosity, physical properties, particulate count and size distribution, and the composition of particulate and dissolved elements in the sample.


Find Patent Forward Citations

Loading…