The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Dec. 16, 2015
Applicant:

Subaru Corporation, Tokyo, JP;

Inventors:

Kazuaki Hirakawa, Tokyo, JP;

Megumi Hiraki, Tokyo, JP;

Kousaburou Akiba, Tokyo, JP;

Assignee:

SUBARU CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G01N 3/02 (2006.01); G01N 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 3/02 (2013.01); G01N 3/00 (2013.01); G06F 17/5018 (2013.01); G01N 2203/0216 (2013.01); G01N 2203/0296 (2013.01);
Abstract

A joint analyzing method includes: performing a data measurement; performing a detailed analysis; performing a simplified analysis; performing a first repetition analysis in which the detailed analysis is repeated while modifying a first analysis model in which geometry of a joint surrounding region is modeled and an analysis technique in the detailed analysis, until a data measurement result and a detailed analysis result are brought into agreement; and performing a second repetition analysis in which the simplified analysis that takes into consideration an initial internal load of at least one junction in a load non-applied state obtained in the first repetition analysis is repeated while modifying a second analysis model rougher in element division of the geometry than the first analysis model and an analysis technique in the simplified analysis, until the data measurement result and a simplified analysis result are brought into agreement.


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