The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 17, 2017
Filed:
Mar. 03, 2010
Gamal K. Mustapha, Surrey, CA;
Jason G. Teetaert, Vancouver, CA;
Gregory P. Jaman, Langley, CA;
Alistair C. Burrows, Steinbach, CA;
Ryan Ramchandar, Winnipeg, CA;
Stephen Liao, Winnipeg, CA;
Geoffrey Chen, Pinawa, CA;
Chris Buzunis, Headingly, CA;
Gamal K. Mustapha, Surrey, CA;
Jason G. Teetaert, Vancouver, CA;
Gregory P. Jaman, Langley, CA;
Alistair C. Burrows, Steinbach, CA;
Ryan Ramchandar, Winnipeg, CA;
Stephen Liao, Winnipeg, CA;
Geoffrey Chen, Pinawa, CA;
Chris Buzunis, Headingly, CA;
SMT Research Ltd., Vancouver, CA;
Abstract
An apparatus, system and method for detecting defects in building structures is provided. The apparatus includes a detector operable to determine an indication of the defect; and a transmitter operable to wirelessly transmit the indication from the apparatus to a central controller. The system includes the detection unit; a locator operable to determine the location of the detection unit; and a memory for storing the indication and the location in association with each other. The memory may be part of a central controller in wireless communication with the detection unit. The apparatus or central controller may include a processor operable to determine from a plurality of measurements performed by the detection unit a resultant measurement vector indicating a direction from the detection unit toward the defect. The detection unit may be operable to autonomously change its location. A display showing resultant measurement vectors at various locations can be produced.