The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Oct. 11, 2012
Applicants:

Eric Koehler, Miami Beach, FL (US);

Mark F. Roberts, North Andover, MA (US);

Roy J Cooley, West Chester, OH (US);

Steve Verdino, Hamilton, OH (US);

Inventors:

Eric Koehler, Miami Beach, FL (US);

Mark F. Roberts, North Andover, MA (US);

Roy J Cooley, West Chester, OH (US);

Steve Verdino, Hamilton, OH (US);

Assignee:

VERIFI LLC, Cambridge, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B28C 7/00 (2006.01); C04B 40/00 (2006.01); B28C 7/02 (2006.01); G05D 21/02 (2006.01);
U.S. Cl.
CPC ...
B28C 7/026 (2013.01); C04B 40/0032 (2013.01); G05D 21/02 (2013.01);
Abstract

The invention relates to a method for adjusting concrete rheology requiring only that load size and target rheology value be selected initially rather than requiring inputs into and consultation of a lookup table of parameters such as water and hydration levels, mix components, temperature, humidity, aggregate components, and others. Dosage of particular rheology-modifying agent or combination of rheology-modifying agents is calculated based on a percentage of a nominal dose calculated with reference to a nominal dose response ('NDR') curve or profile. The NDR profile is based on a correlation between a rheology value (e.g., slump, slump flow, yield stress) and the rheology-modifying agent(s) dose required to change rheology value by one unit (e.g., slump change from 2 to 3 inches) such that exemplary methods can employ corrective dosing based on the NDR and the measured deviation by the system.


Find Patent Forward Citations

Loading…