The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 17, 2017

Filed:

Feb. 14, 2013
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Tomoyuki Makihira, Tokyo, JP;

Kazuhide Miyata, Yokohama, JP;

Koji Nozato, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/10 (2006.01);
U.S. Cl.
CPC ...
A61B 3/14 (2013.01); A61B 3/1025 (2013.01);
Abstract

In order to suppress a load on a subject when a fundus is irradiated with multiple beams, a fundus imaging apparatus for forming an image of a first area in the object, includes: a determination unit for determining a second area other than the first area in the object to be inspected; a detection unit for detecting moving of the object to be inspected on the basis of return light from the second area, which is irradiated with second light; a correction unit for correcting the first area on the basis of the detected moving; and a forming unit for forming an image of the object to be inspected on the basis of the return light from the corrected first area, which is irradiated with the first light.


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