The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Feb. 22, 2012
Applicants:

Alexandre Delattre, Viroflay, FR;

Jérôme Larrieu, Hasparren, FR;

Inventors:

Alexandre Delattre, Viroflay, FR;

Jérôme Larrieu, Hasparren, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 13/02 (2006.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
H04N 13/0246 (2013.01); G06T 7/85 (2017.01); H04N 13/0239 (2013.01); G06T 2207/10012 (2013.01);
Abstract

The present invention concerns the field of stereoscopic photography devices and more precisely calibration thereof. The invention proposes a method for calibrating a stereoscopic photography device that calculates a set of correction parameters for the images. These parameters are classed according to an order of importance. The first-order correction parameters are estimated first, the second-order correction parameters secondly. Advantageously, the first-order parameters are refined by taking account of the estimation values of the second-order parameters. Advantageously, a measurement of the relevance of the scene is carried out before the actual calibration.


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