The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Mar. 06, 2015
Debra J. Danielson, Skillman, NJ (US);
Steven L. Greenspan, Scotch Plains, NJ (US);
James D. Reno, Scotts Valley, CA (US);
Prashant Parikh, Holtsville, NY (US);
Debra J. Danielson, Skillman, NJ (US);
Steven L. Greenspan, Scotch Plains, NJ (US);
James D. Reno, Scotts Valley, CA (US);
Prashant Parikh, Holtsville, NY (US);
CA, Inc., New York, NY (US);
Abstract
Systems and methods may include receiving first data of components, which may represent performance characteristics of the components at a first time. The systems and methods may include performing a first cluster analysis of the first data to identify clusters of the components with similar characteristics. The systems and methods may include receiving second data of the components, which may represent performance characteristics of the components at a second time. The systems and methods may include performing a second cluster analysis of the second data to identify clusters of the components with similar characteristics. The systems and methods may include determining whether a component transitioned from a cluster identified in the first cluster analysis to a different cluster identified in the second cluster analysis. The systems and methods may include determining that an anomaly occurred in response to determining that the component transitioned from the cluster to the different cluster.