The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Jan. 15, 2015
Amdocs Software Systems Limited, Dublin, IE;
Amdocs Software Systems Limited, Dublin, IE;
Amdocs Development Limited, Limassol, CY;
Abstract
A system, method, and computer program product are provided for generating event tests associated with a testing project. In use, an indication of one or more event types is received for creating one or more events on which to perform event testing associated with at least one testing project. Additionally, an indication of one or more parameters associated with the one or more events on which to perform the event testing is received. Further, one or more event files are generated for testing the one or more events based on the one or more event types and the one or more parameters. In addition, the one or more event files are sent to one or more event processing systems for testing the one or more events, the testing of the one or more events including storing information associated with all faults resulting from the testing of the one or more events in a risky events repository that is capable of being utilized to generate testing rules for additional testing projects. Moreover, at least one report including information associated with a result of testing the one or more events is generated.