The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Apr. 29, 2015
Applicant:

Shimadzu Corporation, Kyoto-shi, JP;

Inventors:

Li Ding, Sale, GB;

Aleksandr Rusinov, Altrincham, GB;

Assignee:

SHIMADZU CORPORATION, Kyoto-shi, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/28 (2006.01); H01J 49/40 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
H01J 49/401 (2013.01); H01J 49/065 (2013.01); H01J 49/067 (2013.01); H01J 49/068 (2013.01); H01J 49/282 (2013.01); H01J 49/406 (2013.01);
Abstract

A mass analyser comprises a pair of electrode arrays. Each array has a set of focusing electrodes which are supplied, in use, with voltage to create an electrostatic field in a space between the electrode arrays causing ions to undergo periodic, oscillatory motion in the space, ions passing between electrodes of the sets of focusing electrodes and being repeatedly focused at a center plane, mid-way between the electrode arrays. At least one electrode of each set of focusing electrodes has an electrode surface closer to the center plane than the electrode surfaces of other electrodes of the same set. The analyzer may be an ion trap mass analyser or a multi-turn ToF mass analyzer.


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