The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Apr. 24, 2014
Applicant:
Fom Institute for Atomic and Molecular Physics, Amsterdam, NL;
Inventors:
Ronald Martinus Alexander Heeren, Weesp, NL;
Julia Helga Jungmann, Tallahassee, FL (US);
Don Smith, Tallahassee, FL (US);
Assignee:
AMSTERDAM SCIENTIFIC INSTRUMENTS HOLDING B.V., Amsterdam, NL;
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/38 (2006.01); H01J 49/02 (2006.01); H01J 49/06 (2006.01); H01J 49/40 (2006.01); H05K 1/02 (2006.01);
U.S. Cl.
CPC ...
H01J 49/38 (2013.01); H01J 49/025 (2013.01); H01J 49/06 (2013.01); H01J 49/40 (2013.01); H05K 1/0206 (2013.01); H05K 2201/0195 (2013.01);
Abstract
An ion trap such as an ion cyclotron resonance analyzer cell (trap) is described wherein the ion trap comprises a plurality of electrodes and has at least one integrated ion detector, preferably a position-sensitive and/or time-sensitive ion detector, wherein at least part of said ion detector is configured as an electrode of said ion trap. Methods of position-sensitive detection of ions in such ion trap are described as well.