The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
Feb. 03, 2016
Genprime, Inc., Spokane, WA (US);
Michael Arthur Russell, Spokane, WA (US);
Claire Elizabeth Norton, Spokane, WA (US);
Darby Dawn McLean, Spokane Valley, WA (US);
Jason Buck Somes, Spokane, WA (US);
GENPRIME, INC., Spokane, WA (US);
Abstract
A specimen analysis system includes at least one processor to receive a set of image information that represents an image of at least a specimen validity portion of the specimen test article which includes at least one optical specimen validity marker, the color of which indicates the validity of the specimen; determine a set of color component values for one or more of a plurality of pixels of the image that are representative of the specimen validity portion of the specimen test article, the set of color component values including at least three color component values; and assess at least one specimen validity characteristic of the specimen based at least in part on each color component value of the determined set of color component values for the one or more of the plurality of pixels of the image.