The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Jun. 30, 2015
Applicant:

Synaptics Incorporated, San Jose, CA (US);

Inventors:

Kinh Tieu, Sunnyvale, CA (US);

Anthony Russo, New York, NY (US);

Bob Mackey, San Jose, CA (US);

Kuntal Sengupta, Cupertino, CA (US);

Assignee:

Synaptics Incorporated, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/32 (2006.01); G06T 3/00 (2006.01); G06T 7/33 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00013 (2013.01); G06T 3/0068 (2013.01); G06T 7/337 (2017.01);
Abstract

Systems and methods for image alignment are disclosed. A method includes: determining a first set of patches for a first image and a second set of patches for a second image, wherein each patch in the first and second sets of patches comprises a portion of the first and second image, respectively; determining a set of possible match pairings of a patch from the first set and a patch from the second set; for each match pairing in the set of possible match pairings, computing a transformation operation to align the patch from the first set of patches and the patch from the second set of patches in the match pairing; grouping the match pairings into clusters based on parameters of the transformation operations of the match pairings; and, performing the transformation operation corresponding to at least one cluster to align the first image to the second image.


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