The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2017
Filed:
May. 24, 2016
Ryan Barrett, San Francisco, CA (US);
Othman Laraki, Atherton, CA (US);
Wendy Mckennon, San Francisco, CA (US);
Katsuya Noguchi, San Francisco, CA (US);
Huy Hong, Palo Alto, CA (US);
Ryan Barrett, San Francisco, CA (US);
Othman Laraki, Atherton, CA (US);
Wendy McKennon, San Francisco, CA (US);
Katsuya Noguchi, San Francisco, CA (US);
Huy Hong, Palo Alto, CA (US);
COLOR GENOMICS, INC., Burlingame, CA (US);
Abstract
Methods and systems disclosed herein relate generally to processing data requests from external assessment systems. More specifically, an interface is availed to external assessment systems that accepts an identification of one or more genes. Upon receiving a request identifying one or more genes, a type of access authorized for the requesting external assessment system is assessed. When it is determined that the type of data access indicates that the external assessment system is authorized to access data for the one or more genes, a data repository is queried to identify client data that corresponds to the one or more genes and that indicates or can be used to detect a presence of client-associated variants. A response data set that includes at least some of the client data is transmitted to the external assessment system.