The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 10, 2017

Filed:

Apr. 08, 2015
Applicant:

University of Connecticut, Farmington, CT (US);

Inventors:

Bahram Javidi, Storrs, CT (US);

Adam Markman, Storrs, CT (US);

Mohammad (Mark) Tehranipoor, Storrs, CT (US);

Assignee:

University of Connecticut, Farmington, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 21/62 (2013.01); G09C 5/00 (2006.01); H04L 9/32 (2006.01); H04K 1/00 (2006.01); G06F 21/36 (2013.01);
U.S. Cl.
CPC ...
G06F 21/6218 (2013.01); G06F 21/36 (2013.01); G09C 5/00 (2013.01); H04K 1/006 (2013.01); H04L 9/3226 (2013.01);
Abstract

An optical security method for object authentication using photon-counting encryption implemented with phase encoded QR codes. By combining the full phase double-random-phase encryption with photon-counting imaging method and applying an iterative Huffman coding technique, encryption and compression of an image containing primary information about the object is achieved. This data can then be stored inside of an optically phase-encoded QR code for robust read out, decryption, and authentication. The optically encoded QR code is verified by examining the speckle signature of the optical masks using statistical analysis.


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